Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8171720 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2015 | 10 Pages |
Abstract
We report on methods capable of measuring a rms vertical electron beam size of 3μm with a rms error of less than 10% at a diagnostic beamline at the Swiss Light Source (SLS). This corresponds to a vertical emittance of 0.6 pm rad with a 20% rms error. We showed this capability by presenting the theoretical basis for, and the data from, a series of measurements on a stable beam at 1.6 pm rad vertical emittance at the SLS. The methods presented utilized either Ï- or Ï-polarized synchrotron radiation (SR) in the visible to ultra violet (vis-UV) spectral range. In addition to the established Ï-polarization method, we introduced a diffraction method with a potentially high resolution capability. Also an intensity imbalanced diffraction scheme was introduced, but was found to be prone to SR induced carbon contamination on optical elements.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
J. Breunlin, Ã
. Andersson, N. Milas, Á. Saá Hernández, V. Schlott,