| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8172447 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2015 | 5 Pages |
Abstract
In this paper the results of the first measurements of segmented LGAD devices from 285 μm thick float zone wafers will be discussed. Time resolved Transient-Current-Technique analysis has been performed on strip devices and charge collection measurements have been carried out on pixel detectors to test the LGAD technology on highly segmented devices.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
Emanuele Cavallaro, Jörn Lange, Ivan Lopez Paz, Sebastian Grinstein, Marta Baselga, Virginia Greco, David Quirion, Giulio Pellegrini,