| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8175414 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2014 | 6 Pages |
Abstract
Radiation damage in silicon photomultipliers (SiPM) caused by exposure to 60Co γ-rays is experimentally evaluated and discussed. SiPM devices were irradiated to doses up to 9.4 kGy. Dark current, dark count rate, gain, single photon counting capability, and cross-talk probability among SiPM pixels are evaluated as a function of irradiation dose.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
R. Pagano, S. Lombardo, F. Palumbo, D. Sanfilippo, G. Valvo, G. Fallica, S. Libertino,