| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8178824 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2013 | 5 Pages |
Abstract
In this work, we studied the polarization phenomenon on new Al/p-CdTe/Pt detectors, manufactured by Acrorad (Japan), through electrical and spectroscopic approaches. In particular, we investigated on the time degradation of the spectroscopic response of the detectors at different temperatures, voltages and energies. Current transient measurements were also performed to better understand the properties of the deep acceptor levels and their correlation with the polarization effect.
Related Topics
Physical Sciences and Engineering
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Instrumentation
Authors
F. Principato, A.A. Turturici, M. Gallo, L. Abbene,