| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8180779 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2012 | 5 Pages |
Abstract
We have developed a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using an optical parametric oscillator (OPO) laser system. The laser spot can be focused to â¼2μm diameter, small enough to measure pixel-by-pixel performance of PPDs (pixelated photon detectors). Using multi-wavelength laser light, we plan to probe PPDs at various depths, thanks to their different penetration lengths in the silicon layer. In this paper, details of the commissioning of the laser microscope system and pilot measurements on a PPD at several wavelengths will be presented.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
Koji Yoshimura, Isamu Nakamura,