| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8181180 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2012 | 8 Pages |
Abstract
⺠First demonstration of Thick GEM surface scanning with single photo-electrons. ⺠Resolution of 0.1 mm is sufficient to identify structures connected to TGEM surface field structure. ⺠Gain and detection efficiency and separately measurable. ⺠Detection efficiency is high in a ring around the holes, and gain is constant in the hexagonal collection regions.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
G. Hamar, D. Varga,