| Article ID | Journal | Published Year | Pages | File Type | 
|---|---|---|---|---|
| 819184 | Composites Part B: Engineering | 2011 | 6 Pages | 
Abstract
												An Atomic force microscopy (AFM) based lithography system is successfully designed and constructed for automated patterning through local anodic oxidation. We present the detailed design of this system, where a novel technique is introduced by utilizing a motorized high precision XY stages to provide precise pattern movements while the AFM tip remains stationery. Several in-house hardware such as source measure unit and microscope imaging camera are integrated and controlled by a software tool. Numerous oxide structures are successfully created to demonstrate the ability of this low cost and accurate system, including a 30 μm long cantilever.
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											Authors
												Y.J. Gan, H.Y. Wong, W.P. Lee, 
											