Article ID Journal Published Year Pages File Type
8206440 Physics Letters A 2012 7 Pages PDF
Abstract
► We fabricate nanogaps in gold wires by Electromigration Induced Break Junction. ► We validate a model of electromigration by analysing the fabrication R-V curves. ► The model simulates nanogap formation and predicts main electro-thermal parameters. ► We explain the advantages of this validation method respect to previous methods. ► We debate how model predictions can improve the control of the fabrication process.
Keywords
Related Topics
Physical Sciences and Engineering Physics and Astronomy Physics and Astronomy (General)
Preview
A new validation method for modeling nanogap fabrication by electromigration, based on the Resistance-Voltage (R-V) curve analysis
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