Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8210210 | Applied Radiation and Isotopes | 2014 | 5 Pages |
Abstract
Confocal micro X-ray fluorescence (CM-XRF) with quasi-monochromatic excitation based on polycapillary X-ray optics was used to measure the thickness of multi-ply films. The relative errors of measuring an Fe film with a thickness of 16.3 μm and a Cu film with a thickness of 24.5 μm were 7.3% and 0.4%, respectively. The non-destructive and in-situ measurement of the thickness and uniformity of multi-ply films of Cu, Fe and Ni on a silicon surface was performed. CM-XRF was convenient in in-situ and elementally resolved analysis of the thickness of multi-ply films without a cumbersome theoretical correction model.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
Song Peng, Zhiguo Liu, Tianxi Sun, Guangfu Wang, Yongzhong Ma, Xunliang Ding,