| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8210498 | Applied Radiation and Isotopes | 2013 | 6 Pages |
Abstract
We report a quantitative method for using X-ray fluorescence (XRF) to nondestructively measure the true content of Tl dopant in CsI:Tl scintillator crystals. The instrument is the handheld LeadTracerâ¢, originally developed at RMD Instruments for measuring Pb concentration in electronic components. We describe both the measurement technique and specific findings on how changes in crystal size and growth parameters affect Tl concentration. This method is also applicable to numerous other activator ions important to scintillators, such as Ce3+ and Eu2+.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
Stuart R. Miller, Elena E. Ovechkina, Paul Bennett, Charles Brecher,