| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8212637 | International Journal of Radiation Oncology*Biology*Physics | 2017 | 34 Pages |
Abstract
Compared with other class II devices, RODs experience recalls sooner after market approval and are trending sooner still. Most of these recalls were moderate in severity, and software issues are prevalent. Comprehensive analysis of recall data can identify areas for device improvement, such as better system design among RODs.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
Michael J. BS, Kathryn BS, Vitali PhD, Deborah C. MD, Kevin PhD, Laura PhD, Todd PhD, Derek PhD, Arno J. MD, Todd PhD, Abram MD, Jona A. MD,