Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
822586 | Composites Science and Technology | 2007 | 8 Pages |
The nanostructure formation in polyimide–fullerene composites during thermal treatment was investigated “in situ”, by means of wide-angle (WAXS) and small-angle X-ray scattering techniques. The WAXS patterns of the PI composites do not reveal the presence of C60 reflections. However, the PI/C60 composite, obtained by adding the C60 solution to the diamines-solution during the first step of the reaction (preparation of the polyamic acid, PAA), shows a maximum at small X-ray scattering angles. Results show that this intensity maximum is markedly affected by thermal treatment of the PI/C60 composite, disappearing at high temperature. From “in situ” X-ray scattering experiments, the “manner” in which the C60 nanoparticles are added to the other reactants and influences the properties of the final polymer is discussed.