Article ID Journal Published Year Pages File Type
846164 Optik - International Journal for Light and Electron Optics 2014 4 Pages PDF
Abstract

We present a study of mode characteristics of multilayer metal-dielectric (M-D) structure and use the Eigen mode expansion (EME) method to simulate the subwavelength imaging effect that can be realized at the designed position. We show that the quality of the image is affected not only by absorption but also the finite width of the layers. By proper design and considering the real losses, a super lens with a resolution of about λ0/6 (λ0 is the wavelength in the air) can be obtained. Our researches of this structure point to that a transparent material can be composed from non-transparent materials by alternatively stacking different materials of thin nanofilms, which also provide an opportunity to expand the exploration of the wave propagation in metals, both in the linear and nonlinear regimes.

Related Topics
Physical Sciences and Engineering Engineering Engineering (General)
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