Feasibility of using mutagenic effect of the probe beam polarization state for optical coating absorption measurement

Based on the definition of the azimuth angle of the wave vibration and the reflection theory of the reflectance theoretical calculations of the multilayer optical films with Takashashi model, the dependences of the polarization azimuth angle of the reflected wave from the 1/4 wave piled HR thin film on the temperature, the incident wavelength and the incident angle are discussed. The research results show that the temperature, the incident wavelength and the incident angle of the wave have a significant effect on the polarization azimuth angle of the reflected wave. By the theoretical and experimental analysis, it is pointed out that the phenomenon of the change of the polarization azimuth angle with the temperature can be used to study the weak absorption of the optical thin film and can obtain higher sensitivity under the optimal conditions. The proposed novel method enriches the theory of the photothermal technology.