Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
846726 | Optik - International Journal for Light and Electron Optics | 2016 | 7 Pages |
Abstract
A new white light non-phase-shifting method for eliminating unwanted background in Fourier transform profilometry (FTP) is proposed by using an object image being measured and a single grating image deformed by this object. The background signal of the deformed grating image can be eliminated by using the object image scaled by a contrast ratio of the two images. The proposed method has an advantage over color-encoded FTPs in that the contrast value can be simply calculated from the image itself, regardless of image sensors. Experimental verifications of the proposed method are presented.
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Engineering (General)
Authors
Jaroon Wongjarern, Joewono Widjaja, Porntip Chuamchaitrakool, Panomsak Meemon,