Article ID Journal Published Year Pages File Type
846726 Optik - International Journal for Light and Electron Optics 2016 7 Pages PDF
Abstract

A new white light non-phase-shifting method for eliminating unwanted background in Fourier transform profilometry (FTP) is proposed by using an object image being measured and a single grating image deformed by this object. The background signal of the deformed grating image can be eliminated by using the object image scaled by a contrast ratio of the two images. The proposed method has an advantage over color-encoded FTPs in that the contrast value can be simply calculated from the image itself, regardless of image sensors. Experimental verifications of the proposed method are presented.

Related Topics
Physical Sciences and Engineering Engineering Engineering (General)
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