Structural, optical and dielectric properties of ZrO2 reinforced polymeric nanocomposite films of polymethylmethacrylate (PMMA)

A simplistic sol-casting technique was used to fabricate polymeric nanocomposite film of PMMA–ZrO2. Phase analysis, micro-structure and chemical composition were examined through X-ray diffraction (XRD), Field emission scanning electron microscopy (FESEM) and Fourier transformed infra-red spectroscopy (FTIR). A significant enhancement in absorption coefficient of UV–vis absorption profile was observed with the increase in ZrO2 content. Dielectric properties of the nanocomposite films were studied as a function of frequency and temperature in the ranges of 100 Hz–3 MHz and 313–373 K, respectively. The addition of ZrO2 filler into PMMA markedly enhanced the dielectric constant (ε′ ∼ 26) and suppressed the loss (tan δ ∼ 0.06). Dielectric loss peaks were explained in terms of dielectric relaxation. The value of ac conductivity was found around 7.75×10−5 S m−1 at 373 K and 3 MHz. The Conducting behavior of the nanocomposite film was ascribed to hopping mechanism. The synergistic combination of ZrO2 and PMMA can be used as an appropriate candidate for high frequency capacitor application.