Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
847839 | Optik - International Journal for Light and Electron Optics | 2016 | 4 Pages |
Abstract
We study light scattering by surface roughness assisted by excitation of guided modes in dielectric layers. The same roughness might result in a very different scattering efficiency depending on whether and how the guided modes participate in scattering. Enhanced scattering to modes with a different modal number and to modes propagating backward is predicted and observed.
Related Topics
Physical Sciences and Engineering
Engineering
Engineering (General)
Authors
Rabi Rabady, Ivan Avrutsky,