Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
848501 | Optik - International Journal for Light and Electron Optics | 2014 | 4 Pages |
The transparent conductive pure and doped zinc oxide thin films with aluminum, cobalt and indium were deposited by ultrasonic spray technique on glass substrate at 350 °C. This paper is to present a new approach to the description of correlation between electrical conductivity and crystallite size with dopant concentration of Al, Co and In. The correlation between electrical and structural properties with dopant concentration suggests that the electrical conductivity of the films is predominantly estimated by the crystallite size and the concentration of Al, Co and In. The measurement in the electrical conductivity of doped films with correlation is equal to the experimental value of without undoped ZnO thin films, here the error is limited to zero %. The minimum error value was estimated in the cobalt and indium doped ZnO thin films. The correlation between the electrical conductivity and the crystallite size with the doping concentration was investigated.