Article ID Journal Published Year Pages File Type
848505 Optik - International Journal for Light and Electron Optics 2014 6 Pages PDF
Abstract

Owing to impurity concentration, is important in chalcogenide glass to study various commercial applications, this paper presents a novel technique to measure the impurity concentration in chalcogenide glass at wavelength of 633 nm and 1500 nm using optical principle. Here both reflection and absorption losses are considered to estimate the same impurities. Reflectance is found using plane wave expansion method, where absorption factor is determined using Maxwell's curl equations. Simulation result reveals that reflectance, absorption factor and transmitted intensity vary linearly with respect to different impurity concentrations. The excellent linear variation of transmitted intensity gives an accurate measurement of impurity concentration in chalcogenide at aforementioned wavelength.

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Physical Sciences and Engineering Engineering Engineering (General)
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