Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
848516 | Optik - International Journal for Light and Electron Optics | 2014 | 4 Pages |
Abstract
To solve the problem in projecting grating method, the paper presents an inspection method based on phase image processing for glass defects. In the proposed method, the wrapped phase difference is achieved according to the images of defect-free and defect-containing. The unwrapping phase algorithm, based on jump corrected is used to eliminate jump error. The segmentation of defect region is implemented by integrating grayscale mathematical morphology with high-low threshold segmentation, and the boundary coordinate of connected region is used to calculate the size and location of defect. The results demonstrate that the proposed method provides reliable identification of defects.
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Authors
Yong Jin, Zhaoba Wang, Yu Chen, Xiaoli Kong, Limei Wang, Weizhe Qiao,