Article ID Journal Published Year Pages File Type
848606 Optik - International Journal for Light and Electron Optics 2014 4 Pages PDF
Abstract

A series of CdxZn1−xS thin films have been deposited on glass substrates using spray pyrolysis technique. The crystallinity and microstructure of CdxZn1−xS thin films have been investigated by X-ray diffraction (XRD). Based on the results of Hall measurements, the films obtained were an n-type semiconductor. The X-ray data analysis of CdxZn1−xS thin films showed that the grain size of the CdxZn1−xS increased with increase in Cd composition. It is observed that the band gap increases as the Cd composition decreases. The results also showed a blue shift of absorption edge of optical transmission spectra is increases as Zn ratio increases. The effects of Cd composition on the structural and optical properties of CdxZn1−xS thin films were related to their grain size, stress and carrier concentration.

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