Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
849014 | Optik - International Journal for Light and Electron Optics | 2014 | 4 Pages |
Abstract
The mechanism of the high light absorption of surface-microstructure silicon is discussed using optical simulation based on Monte Carlo method in this article. Calculation results indicate that the micro-structured surface and high refractive index of material are the two key factors that effectively reduce the reflection, especially transmittance, of the material instead of surface wave and sulfur. In addition, this shows clearly a development in direction for manufacturing new type detectors and increasing the efficiency of traditional detector effectively in the future.
Related Topics
Physical Sciences and Engineering
Engineering
Engineering (General)
Authors
Guojin Feng, Yu Wang, Li Zhao,