Measurement of nonlinear refractive index of pure and doped KTP crystals by Z-scan technique using cw He–Ne Laser

Single crystals of pure, Mo and W doped KTP crystals were grown by flux technique. The grown crystals were subjected to various characterization studies such as EDX, powder XRD, FTIR and UV analysis. The SHG efficiencies of the pure and doped KTP crystals were measured by Kurtz–Perry technique and it was found that the doped KTP crystals exhibit higher values of SHG. Nonlinear refractive indexes were measured on different growth planes of pure and doped crystals by Z-scan method using a cw (continuous wave) He–Ne laser at 632.8 nm. The measured values of nonlinear refraction of different planes were in the order of 10−12 cm2/W.