Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
849221 | Optik - International Journal for Light and Electron Optics | 2013 | 4 Pages |
Abstract
Nanocrystalline ZnO thin films are deposited through two different chemical methods: (i) the films prepared by ultrasonic spray with 0.1 M and (ii) dip-coating from zinc acetate complex solutions with 0.5 M, the films obtained at different temperatures. The XRD analyses indicated that ZnO films have nanocrystalline hexagonal structure with (0 0 2) preferential orientation and the maximum crystallite size value of 103 nm measured from the films prepared by dip-coating. UVvis measurement indicated that all films are transparency in the visible region. The optical band gap increased with decreasing of the Urbach tail energy indicating that the increase in the transition tail width and decrease of the defects, respectively.
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Authors
Said Benramache, Boubaker Benhaoua, Foued Chabane, Abderrazak Guettaf,