Article ID Journal Published Year Pages File Type
849455 Optik - International Journal for Light and Electron Optics 2014 4 Pages PDF
Abstract

We present a line-scan camera calibration method in a plane not perpendicular to but parallel to the optical axis, without requiring the camera motion or a complex calibration pattern. A random 2D reference coordinate system in the calibration plane can be used, images of a rod perpendicular to the calibration plane at known coordinates are captured by the camera, the relation between the given coordinates and the rod image centroid position are analyzed based on a reduced pinhole model and image processing, and then the camera parameters and distortion factors are all estimated. These distortion factors build a sample relation only between the image position in theory and in practice, and they do not change with object position. Two wide-angle line-scan cameras that are used in a 2D-coordinate measurement system are calibrated by this method; the application results illustrate the effectiveness and convenience of this method.

Related Topics
Physical Sciences and Engineering Engineering Engineering (General)
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