| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 849911 | Optik - International Journal for Light and Electron Optics | 2013 | 4 Pages |
Abstract
Nanocrystalline TiO2 thin films have been prepared by sol–gel dip coating method. X-ray diffraction results showed the formation of anatase phase TiO2 with grain size in the range of 18–26 nm. The HRTEM studies show that the average particle size of TiO2 is 24 nm. The EDX analysis confirmed that Ti and O elements are present in the samples. The optical absorption spectra reveal that the absorption edge shifts towards longer wavelength side with increase in annealing temperature.
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Authors
A. Ranjitha, N. Muthukumarasamy, M. Thambidurai, R. Balasundaraprabhu, S. Agilan,