Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
850107 | Optik - International Journal for Light and Electron Optics | 2013 | 5 Pages |
Fringe projection profilometry (FPP) is a widely used three-dimensional profile measurement technique. One vital step in this technique is calibration, which determines the system accuracy. The least-squares method, because of its flexibility and simplicity, is commonly used in system calibration for FPP. However, calibration results are affected by the nonlinear gamma of the projector and projection fringe cycle broadening. This paper proposes a new look-up table (LUT) generation method by analyzing the differences between the real and ideal unwrapped phases. The aforementioned problems could then be solved after the phase error is compensated by the LUT. Finally, the validity of the proposed method is demonstrated through experiments, and the accuracy reaches 0.02 mm.