| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 850953 | Optik - International Journal for Light and Electron Optics | 2009 | 5 Pages |
Abstract
In this paper, a new optical particle-sizing instrument is presented for determination of particle sizes from 1 to 100 μm. Based on the Chin–Shifrin inversion method and digital image processing, the new system gives very accurate results for a calibrated testing sample and industrial cement particles.
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Engineering
Engineering (General)
Authors
S. Houmairi, K. Assid, A. Nassim, S. Rachafi, A. Cornet,