Micro- and macro deformation measurement by extension of correlation technique

In this work, we present the implementation of Electronic Speckle Pattern Interferometry (ESPI), Digital Speckle Photography (DSP) and Digital Image Correlation (DIC) as complementary techniques to measure in-plane micro and macro displacement. The main advantage of ESPI is its great sensitivity to small displacements (smaller than the size of the speckle). However, the contrast of fringes in this technique is severely affected by de-correlation effects when the in-plane displacement exceeds the size of the speckle. To eliminate the de-correlation effects, we use the DSP technique. It is possible to generate artificial speckles, usually bigger than those generated by means of illumination of the sample with laser light. By combining DSP and DIC the displacement field can be obtained when the ESPI method cannot be applied due to image de-correlation. The experimental results show that the combination of these techniques is useful to analyze deformations over a wider range.