Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
851532 | Optik - International Journal for Light and Electron Optics | 2012 | 4 Pages |
Abstract
Based on Gaussian decomposition method, we present a theoretical investigation on the astigmatic Gaussian beam Z-scan when materials possess the simultaneous third- and fifth-order nonlinear refraction effects, and obtain an analytic expression of normalized transmittance of the Z-scan trace for the case of pinhole. The influences of ellipticity and waist separation on the Z-scan curves are analyzed. We find that normalized transmittance difference between the peak and the valley in Z-scan curves decreases gradually with the increment of the waist separation or with the decrement of the ellipticity.
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Authors
Shi-Zhuan Lu, Kai-Ming You, Deng-Yu Zhang, Feng Gao,