Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
851751 | Optik - International Journal for Light and Electron Optics | 2006 | 7 Pages |
Abstract
An optical method, combining the projection of a structured light pattern with the digital correlation technique, is discussed in this paper. This method allows measurement of full-field profile on object surface of about 20 mm square size. Tests on a rotated plane surface have been performed in order to quantify the method capabilities. It is shown that this technique leads to an accuracy of about 1 μm for a spatial resolution of around half a millimeter. Profile measurements of a micro-engraved object and at the crack tip of a polymer sample are also presented. Results give proof that this technique remains efficient even in presence of important height slope.
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Authors
Jean Brillaud, Fabienne Lagattu,