Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
852133 | Optik - International Journal for Light and Electron Optics | 2010 | 9 Pages |
Abstract
This work presents an analysis of the lens system in a thermionic scanning electron microscope (SEM) using a numerical computation and an optics-based calculation. The behaviors and characteristics of the electron beam are analyzed and the focusing capability is investigated. The beam spot size is estimated by calculation and proved by experiment. The characteristics and properties determining the SEM performance are investigated for various design parameters through a numerical analysis and an optics-based calculation. Particularly, a combination of two approaches gives more detailed information than a single approach in investigating an extremely small beam spot by demagnification through the electromagnetic lens system in a SEM column.
Related Topics
Physical Sciences and Engineering
Engineering
Engineering (General)
Authors
Dong Hwan Kim, Keun Park, Man Jin Park, Hyun-Woo Jung, Dong Young Jang,