| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 852533 | Optik - International Journal for Light and Electron Optics | 2007 | 7 Pages |
Abstract
In the process of interferometric testing, the measurement result is influenced by the system structure, which reduces the measurement accuracy. To obtain an accurate test result, it is necessary to analyze the test system, and build the relationship between the measurement error and the system parameters. In this paper, the influences of the system elements which include the collimated lens and the standard surface on the interferometric testing are analyzed, the expressions of phase distribution and wavefront error on the detector are obtained, the method to remove some element errors is introduced, and the optimization structure relationships are given.
Related Topics
Physical Sciences and Engineering
Engineering
Engineering (General)
Authors
Xiaojun Cao, Jianqiang Zhu, Yanhong Li, Qiang Lin,