Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
852664 | Optik - International Journal for Light and Electron Optics | 2008 | 6 Pages |
Abstract
For a circularly polarized plane wave incident normally on a chiral sculptured thin film (STF), we determined that light pressure per unit thickness on the film is high when the incident plane wave and the chiral STF are co-handed, the loss factor in the chiral STF is as low as possible, the wavelength is either the center-wavelength of the Bragg regime or close to it, and the ratio of the film thickness normalized by the period is moderately high.
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Authors
Benjamin M. Ross, Akhlesh Lakhtakia,