| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 853009 | Procedia Engineering | 2016 | 7 Pages |
Abstract
The influence of the number-average diameter and the average number of the most represented particles on surface-active (acid-base) properties using the semiconductor CdSe-CdTe system is traced. The correlations between structural characteristics (dav, nav) and the acid sites strength (pH of a surface isoelectric state-pHisi) attract the attention, representing a doubtless practical interest.
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Physical Sciences and Engineering
Engineering
Engineering (General)
Authors
I.A. Kirovskaya, T.L. Bukashkina, D.A. Polonyankin,