Article ID Journal Published Year Pages File Type
857361 Procedia Engineering 2014 9 Pages PDF
Abstract

The simultaneous combination of scanning probe methods (tunneling and force microscopies, STM and AFM) is a unique way to get information about crystallographic and electronic structure of the studied surface. Here we apply these methods accompanied by the state- of-the-art density functional theory (DFT) calculations to shed a light on the structure and electronic properties of the strongly-corrugated graphene/Rh(111) system. The atomically-resolved images are obtained for both STM and AFM modes and compared with the DFT results showing good agreement between theory and experiment.

Related Topics
Physical Sciences and Engineering Engineering Engineering (General)