Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
857361 | Procedia Engineering | 2014 | 9 Pages |
Abstract
The simultaneous combination of scanning probe methods (tunneling and force microscopies, STM and AFM) is a unique way to get information about crystallographic and electronic structure of the studied surface. Here we apply these methods accompanied by the state- of-the-art density functional theory (DFT) calculations to shed a light on the structure and electronic properties of the strongly-corrugated graphene/Rh(111) system. The atomically-resolved images are obtained for both STM and AFM modes and compared with the DFT results showing good agreement between theory and experiment.
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