Conformity Analysis in the Measurement of Machined Metal Surfaces with Optoelectronic Profilometer

The objective of this work is to analyse the conformity of the roughness parameters measured with an optoelectronic profilometer in order to make equivalent the measurement results with those obtained with traditional contact devices. The working parameters of the optoelectronic profilometer are based on computational filters which are controlled by software working with a 3D stratified colour map (chromatic fragmentation of the white light). However, these parameters substantially differ from the usual contact profilometers that work with 2D roughness profiles (cut-off, evaluation length, contact stylus radii). This work pursues to find the optical profilometer parameters, and its values, that ensure the best quality measurement for a wide range of machining process.