Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
859781 | Procedia Engineering | 2013 | 10 Pages |
The CT process for metrology applications is very complex because has many factors that influence the loss of accuracy during CT measurements. One of the most critical is the edge detection also called surface extraction or image segmentation, which is the process of surface formation from the CT‘s volume data that represents a grey value corresponding to the mass attenuation coefficient of the object material. This paper presents different edge detection methods commonly used in areas like machine and computer vision and they are analyzed as an alternative to the common methods used in CT for metrology applications. Each method is described and analyzed separately in order to highlight its advantages and disadvantages from a metrological point of view. An experimental comparative between two of them is also shown.