Efficient Test Data Compression Achieved by Reduced Control Code

Test data compression is a major scenario in all system-on-a-chip (SOC) designs for reducing the volume of the test data. The volume of the test data directly affects the cost of SOC design. Many compression techniques have been proposed to achieve better compression. Although all the techniques proposed are applied only for those test data having larger number of unspecified bits (X's), it is not able to achieve better compression for those test data having larger number of specified values (0's and 1's). In this paper a new compression technique is proposed to achieve higher compression for test data having larger number of specified values by reducing the size of the control code. In this method the length of the control code is significantly reduced. The proposed technique is applied on ISCAS’89 benchmark circuits and its results are compared with existing method