Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8915536 | Journal of Applied Geophysics | 2018 | 29 Pages |
Abstract
We performed different tests to determine the range of 2-D models consistent with the data. Our approach was based on synthetic studies, comprising of hypothesis testing and the use of a priori information throughout the inversion procedure as well as forward modeling. We conclude that the minimum depth extent of the conductive layer beneath the southwest of the profile can be determined as approximately deeper than 15Â km and also the screening effect of the conductive overburden is highly intense in this model and prevents the deep structures from being resolved properly.
Related Topics
Physical Sciences and Engineering
Earth and Planetary Sciences
Geophysics
Authors
T. Layegh Haghighi, M. Montahaei, B. Oskooi,