| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8955377 | Journal of Materiomics | 2018 | 10 Pages |
Abstract
We study the effects of oxygen and moisture on I-V characteristics of the TiO2 thin film by performing conductive Atomic Force Microscopy (c-AFM) measurements in different environments. In addition, the local ionic dynamic of TiO2 during the resistive switching are also studied.188
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Wanheng Lu, Lai-Mun Wong, Shijie Wang, Kaiyang Zeng,