| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8955839 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2018 | 4 Pages |
Abstract
Pendellösung interferometry is one of the technique for accurate determination of the structure factors of crystals. Observation method of Pendellösung fringes by using pulsed cold neutrons and the time-of-flight analysis were established. We measured the nuclear scattering length of silicon by the Pendellösung fringes with pulsed neutrons as (4.125±0.003(stat.)±0.028(syst.)). This indicates the applicability of Pendellösung interferometry at high-intensity pulsed neutron facilities for various precision measurements.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
Shigeyasu Itoh, Masaya Nakaji, Yuya Uchida, Masaaki Kitaguchi, Hirohiko M. Shimizu,