| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9021785 | International Congress Series | 2005 | 4 Pages |
Abstract
Our results demonstrate that pattern of two components (P100m and N145m) on the VEFs does not reflect only hemianopsia, but also USN caused by deficits of the cortical process of attention.
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Authors
Katsuhiro Mizuno, Tetsuya Tsuji, Yoshihisa Masakado, Tetsuo Ota, Kaoru Honaga, Meigen Liu, Akio Kimura, Hisao Ohde,