Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9509510 | Journal of Computational and Applied Mathematics | 2005 | 5 Pages |
Abstract
In a recent paper (Computation of the smallest even and odd eigenvalues of a symmetric positive-definite Toeplitz matrix, SIAM J. Matrix Anal. Appl. 25 (2004) 949-963) Melman proved a recurrence relation of the even and odd characteristic polynomials of a real symmetric Toeplitz matrix T on which a symmetry exploiting method for computing the smallest eigenvalue of T can be based. In this note, we present a proof of the recurrence relation which is less technical and more transparent.
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Physical Sciences and Engineering
Mathematics
Applied Mathematics
Authors
Aleksandra KostiÄ, Heinrich Voss,