Article ID Journal Published Year Pages File Type
9509510 Journal of Computational and Applied Mathematics 2005 5 Pages PDF
Abstract
In a recent paper (Computation of the smallest even and odd eigenvalues of a symmetric positive-definite Toeplitz matrix, SIAM J. Matrix Anal. Appl. 25 (2004) 949-963) Melman proved a recurrence relation of the even and odd characteristic polynomials of a real symmetric Toeplitz matrix T on which a symmetry exploiting method for computing the smallest eigenvalue of T can be based. In this note, we present a proof of the recurrence relation which is less technical and more transparent.
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Physical Sciences and Engineering Mathematics Applied Mathematics
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