| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9566889 | Applied Surface Science | 2005 | 7 Pages |
Abstract
In this work, the micro-structural evolution of irradiated Ni/Al multi-films is analyzed by transmission electron microscopy (TEM) measurements to justify the properties change. The grain size can be obtained to be laterally oscillating between 5 and 10Â nm and up to 100Â nm and the layer interface to be semicoherent. Up to a certain depth, intermetallic compounds are found in the layer interface.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
C. Daniel, F. Mücklich,