Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9566932 | Applied Surface Science | 2005 | 6 Pages |
Abstract
The damage induced by ultrashort, 130 fs, near-infrared, 800 nm, Ti:sapphire laser pulses in 1 μm thick triazenepolymer films on glass substrates has been investigated. Real-time reflectivity measurements with a ps-resolution streak camera and a ns-resolution photodiode set-up have been performed to study in situ the structural transformation dynamics upon single-pulse excitation with laser fluences above the threshold of permanent damage. Scanning force microscopy has been used to probe ex situ the corresponding surface topography of the ablated spots. Modulated lateral force microscopy (M-LFM) has been applied to observe alterations of the local friction properties within and around the irradiated areas.
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Authors
J. Bonse, S.M. Wiggins, J. Solis, T. Lippert, H. Sturm,