Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9566970 | Applied Surface Science | 2005 | 6 Pages |
Abstract
Sm-Fe thin films were deposited on a Si wafer coated with a â¼100 nm thick layer of Ta by ablating a solid Sm-Fe target. The Sm-Fe target was ablated using a molecular fluorine laser with λ = 157 nm at low laser energy of â¼25 mJ/pulse. The thickness of the deposited amorphous film (in vacuum) was â¼20 nm and the dimensions of the nanocrystals deposited on the Si-Ta substrate (in He atmosphere) varied between 20 and 500 nm. Using the low energy laser for growing Sm-Fe nanocrystals by pulse laser deposition (PLD) results in a composition, which remains the same as the composition of the initial target. The morphology and the type of the films depended on the depositing experimental conditions.
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Authors
S. Kobe, K. Žužek, E. Sarantopoulou, Z. Samardžija, Z. Kollia, A.C. Cefalas,