Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9567026 | Applied Surface Science | 2005 | 9 Pages |
Abstract
Both, sputter-clean polycrystalline iron substrate and finally grown Fe2.2O3 layer, were investigated by the EPES method to measure the electron transport parameters used for quantitative electron spectroscopy, such as the electron inelastic mean free path (IMFP) values. The IMFPs were measured in the electron kinetic energy range 200-1000Â eV with the Cu standard. The surface excitation parameters using Chen and Werner et al. approaches were evaluated and applied for correcting these IMFPs. The discrepancies between the evaluated parameters obtained using the above quantitative and qualitative approaches for characterising the iron oxide layers were discussed.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
B. Lesiak, A. Jablonski, J. Zemek, P. Jiricek, M. ÄerÅanský,