| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9567098 | Applied Surface Science | 2005 | 6 Pages |
Abstract
Raman spectra of the films show relatively sharp phonon peaks, a single one for PrxOy and a rich spectrum for HfO2, clearly evidencing crystalline areas. This is corroborated by substrate Raman spectra which indicate a stressed interface, pointing to epitaxial PrxOy and HfO2 film growth, respectively, during the initial stages of growth.
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Authors
M. Ratzke, D. Wolfframm, M. Kappa, S. Kouteva-Arguirova, J. Reif,