Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9567333 | Applied Surface Science | 2005 | 4 Pages |
Abstract
Exposure of Pt/GaN and Pt/AlGaN/GaN Schottky diodes to H2 gas at moderately high temperatures around 100 °C resulted in marked increase of forward and reverse currents. Increase was much larger in the Pt/AlGaN/GaN diode than in the Pt/GaN diode. Rapid turn-on responses and somewhat slower turn-off responses were observed with reproducible response magnitudes. A rigorous computer simulation of I-V curves indicated that current changes are due to changes in the Schottky barrier height caused either by H-induced formation of interfacial dipole or by hydrogen passivation of interface states.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Kazushi Matsuo, Noboru Negoro, Junji Kotani, Tamotsu Hashizume, Hideki Hasegawa,